| Optical microscope |
Date and time |
The date and time when the measurement was
performed |
| Sample length long (mm) |
The maximum caliper
length of an individual particle (mm) measured on a microscope image captured in the clean chamber. This information is given only
for individual particles, not for aggregates |
| Sample length short (mm) |
The minimum caliper length, of an individual particle (mm) measured on a microscope image captured in the clean chamber. This information is given only
for individual particles, not for aggregates |
| Sample length height (mm) |
The sample length (mm) measured by focusing on the top and bottom of the particle using the optical microscope.
This information is given only for individual particles, not for aggregates |
| Image |
A microscopic image of the sample captured by the
microscope system |
| Scaled image |
A microscopic image of the sample with two lines
representing a long and a short length of the sample, respectively |
| Comment |
A remark for the measurement or data |
| Weight |
Date and time |
The date and time when the measurement was
performed |
| Total weight (mg) |
The sample weight (mg), including the sample dish weight,
measured by the electric balance in the clean chamber. This is an average of five
weight measurements |
| Sample dish weight (mg) |
The sample dish weight (mg) measured by the electric
balance in the clean chamber. This is an average of five measurements |
| Sample weight (mg) |
The sample weight (mg), excluding the sample dish weight,
measured by the electric balance in the clean chamber. This is an average of five
weight measurements |
| Sample weight error (mg) |
The standard deviation as a measurement error of the
sample weight (mg) calculated |
| Dish |
The ID of the sample dish |
| Comment |
A remark for the measurement or data |
| FT-IR |
Date and time |
The date and time when the measurement was
performed |
| Spectrum image |
A spectrum chart of the sample measured by the FT-IR
system. The chart shows the relative reflectance intensity per wavelength
(mm) |
| ROI image |
Images file of the sample taken by the FT-IR system. This
optical image shows the measured region of interest by the laser guide from the
FT-IR system |
| ROI light image |
Images file of the sample taken by the FT-IR system. This
optical image shows the measured region of interest by the laser guide and the
supplemental light from the FT-IR system |
| CSV file |
A CSV file of the spectrum image, including the
information on measurement conditions |
| Comment |
A remark for the measurement or data |
| MicrOmega |
Date and time |
The date and time when the measurement was
performed |
| Position |
The number of the measurement position. When the target
sample is larger than the field of view of MicrOmega, this position number is used
to identify the measurement area during measurement |
| Angle (°) |
The sample’s horizontal rotation angle (degree) on the
sample stage. This value is relative and used to identify the measurement position
easier during measurement |
| Monochromatic image |
Images file of the sample captured by MicrOmega. This is
a reflectance intensity map of a single wavelength (2.50 µm ) |
| ROI image |
Where available, image file of the sample captured by
MicrOmega. The image shows the region of interest in color |
| ROI spectrum image |
Where available, a chart of the average reflectance
spectrum of the region of interest displayed in the ROI image measured by
MicrOmega, |
| ROI spectrum CSV |
Where available, a CSV file of the average reflectance
spectrum of the region of interest displayed in the ROI image measured by
MicrOmega |
| Comment |
A remark for the measurement or data |
| Multi-band spectroscopy |
Date and time |
The date and time when the measurement was
performed |
| Measurement condition CSV |
A CSV file describing the information of measurement
conditions |
| IF map image |
Reflectance (radiance factor or I/F) map at 550 nm
(v-band) measured with an incidence angle of 30°, emission angle of 0°, and phase
angle of 30°. The photometric effect due to the roughness of the sample surface is
not corrected. The solid line outlines the particle rim and the dashed line
represents the region used to calculate the particle-averaged spectrum |
| Color ratio image |
Color map showing the v-to-b band ratio (R550/R480 nm).
The solid line marks the particle rim and the dashed line shows the region used to
calculate the particle-averaged spectrum |
| Average spectrum image |
Particle-averaged spectrum taken by the multi-band
spectroscopy system in absolute reflectance
(Left) and reflectance normalized at 550 nm
(Right). The spectrum of each particle (solid
black line) is compared with the brightest (orange dashed line), darkest (green
dashed line), most red-colored (red dashed line), and most blue-colored (blue dashed
line) particles. Error bars show the measurement uncertainty reported by Cho et al.
(2022).
The photometric effect due to the roughness of the sample surface is not
corrected |
| Comment |
A remark for the measurement or data |
| Stereo imaging |
Date and Time |
The date and time when the measurement was
performed |
| Elevation map image |
Microscopic image
(Left) and elevation map
(Right) of the particle. The elevation map was
calculated from a 3D digital elevation model using a structure from motion
technique, and the sample was imaged from multiple angles |
| Comment |
A remark for the measurement or data |